发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To provide a technique capable of removing impurities remaining in a thiin film during film formation and altering performance of the thin film as impurity concentration changes.SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: activating a modifying gas including at least one of a reducer, a nitriding agent and an oxidizer by plasma excitation; and modifying the thin film formed on the substrate by irradiating the thin film with the activated modifying gas.SELECTED DRAWING: Figure 6 |
申请公布号 |
JP2016125104(A) |
申请公布日期 |
2016.07.11 |
申请号 |
JP20150000877 |
申请日期 |
2015.01.06 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
IZUGAI MOTOMU;NAKAYAMA MASANORI;HARADA KAZUHIRO;KITAMURA TADASHI |
分类号 |
C23C16/56;C23C16/34;C23C16/455;C23C16/509;H01L21/28 |
主分类号 |
C23C16/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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