发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a technique capable of removing impurities remaining in a thiin film during film formation and altering performance of the thin film as impurity concentration changes.SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: activating a modifying gas including at least one of a reducer, a nitriding agent and an oxidizer by plasma excitation; and modifying the thin film formed on the substrate by irradiating the thin film with the activated modifying gas.SELECTED DRAWING: Figure 6
申请公布号 JP2016125104(A) 申请公布日期 2016.07.11
申请号 JP20150000877 申请日期 2015.01.06
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 IZUGAI MOTOMU;NAKAYAMA MASANORI;HARADA KAZUHIRO;KITAMURA TADASHI
分类号 C23C16/56;C23C16/34;C23C16/455;C23C16/509;H01L21/28 主分类号 C23C16/56
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