| 摘要 |
PURPOSE:To decide a defective device under testing operation by providing a means for giving a testing condition to a device to be tested, measuring means of an electrical characteristic of the device to be tested, and a means for deciding the result of measurement of the measuring means at every prescribed time. CONSTITUTION:An instruction for measuring the electric characteristic of an electronic device mounted to a testing device 5 is supplied to a measuring machine at every prescribed time in accordance with a program incorporated in advance from a computer 7. Also, a measuring machine 6 sends a value of the electric characteristic of the device performed in the device 5, to the computer 7, and the computer 7 decides the electric characteristic, counts non-defectives and defectives, and also executes the calculation of a residual defective rate.
|
