发明名称 |
Automatic flaw detection device |
摘要 |
An automatic flaw detection apparatus comprises a supporting frame; a hollow shaft which is supported on said frame in a freely rotatable manner through a bearing, and through the interior of which passes a material to be inspected; a holder disposed within said hollow shaft, and extending in the longitudinal direction of the axis of said hollow shaft, and rotating in association with said hollow shaft; sensing means incorporated in said holder to detect any defect in said material to be probed; and a signal transmission device interposed between said hollow shaft and said supporting frame, and to transmit the flaw detection signal from said sensor means to outside.
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申请公布号 |
US4554835(A) |
申请公布日期 |
1985.11.26 |
申请号 |
US19840590449 |
申请日期 |
1984.03.16 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
SAKURAGI, TOSHIO;NAKAYAMA, KAZUO;SATO, MASAAKI;KOIKE, MITSUHIRO |
分类号 |
G01N29/04;G01N29/26;G01N29/28;(IPC1-7):G01N29/04 |
主分类号 |
G01N29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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