发明名称 Automatic flaw detection device
摘要 An automatic flaw detection apparatus comprises a supporting frame; a hollow shaft which is supported on said frame in a freely rotatable manner through a bearing, and through the interior of which passes a material to be inspected; a holder disposed within said hollow shaft, and extending in the longitudinal direction of the axis of said hollow shaft, and rotating in association with said hollow shaft; sensing means incorporated in said holder to detect any defect in said material to be probed; and a signal transmission device interposed between said hollow shaft and said supporting frame, and to transmit the flaw detection signal from said sensor means to outside.
申请公布号 US4554835(A) 申请公布日期 1985.11.26
申请号 US19840590449 申请日期 1984.03.16
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SAKURAGI, TOSHIO;NAKAYAMA, KAZUO;SATO, MASAAKI;KOIKE, MITSUHIRO
分类号 G01N29/04;G01N29/26;G01N29/28;(IPC1-7):G01N29/04 主分类号 G01N29/04
代理机构 代理人
主权项
地址