发明名称 |
CONDUCTIVE MODULATION TYPE MOSFET |
摘要 |
PURPOSE:To suppress a latchup phenomenon by setting an interval of the first conductive type base layers opposed at an interval via the second conductive type semiconductor layer under a gate electrode to a specific interval. CONSTITUTION:An n<-> type layer 12 and a gate oxide film 15 are formed on a p<+> type Si substrate 11 and a gate electrode 16 of a polysilicon film is formed. Boron is diffused to form a p type base layer 13. As ions are implanted, heat treatment is performed to form an n<+> type source layer 14. A source electrode 17 is formed by depositing and patterning an aluminum film. A drain electrode 18 is formed by depositing a V-Ni-Au film. The opposing distance (a) of the layer 13 under the electrode 16 is set to small value of 20mum or less, thereby obtaining a conductive modulation type MOSFET which does not cause a latchup up to 750A/cm<2>. |
申请公布号 |
JPS60236265(A) |
申请公布日期 |
1985.11.25 |
申请号 |
JP19840092444 |
申请日期 |
1984.05.09 |
申请人 |
TOSHIBA KK |
发明人 |
NAKAGAWA AKIO;WATANABE KIMINORI |
分类号 |
H01L29/08;H01L29/45;H01L29/739;H01L29/78 |
主分类号 |
H01L29/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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