| 摘要 |
PURPOSE:To cause a semiconductor memory device incoporating a self-diagnostic circuit to execture the initial setting automatically by writing certain information to an information cell and a testing cell at the time of turning on a power source. CONSTITUTION:At the time of turning on a power source, a row address counter 1, a column address counter 6, a write information generator circuit 16, etc., act in correspondence to a start circuit 15, and rows and columns are selected. Then circuits 16 are sequentially generated in an entire information cell of a memory cell array 5 and an entire testing cell, and data corresponding to a checking of a built-in error correction circuit 11 through a data input buffer 12 is written. With this constitution, the initialization of a semiconductor memory incorporating a self-diagnostic circuit can be automatically executed without carring out a troublesome write operation, and the semiconductor memory which can be easily handled can be obtained.
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