发明名称 FAST SYSTEM AVAILABILITY MEASUREMENT APPARATUS FOR SYSTEM DEVELOPMENT AND METHOD THEREOF
摘要 Disclosed are a system availability measurement device for system development and a method thereof. According to an embodiment of the present invention, the system availability measurement device comprises the following steps of: generating an error in a system and detecting a fault to measure a time for repairing the fault; and measuring system availability by using the measured fault repairing time.
申请公布号 KR20160098929(A) 申请公布日期 2016.08.19
申请号 KR20150021205 申请日期 2015.02.11
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 LEE, KWANG YONG;LEE, JUNG HWAN
分类号 G06F11/34 主分类号 G06F11/34
代理机构 代理人
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