发明名称 |
FAST SYSTEM AVAILABILITY MEASUREMENT APPARATUS FOR SYSTEM DEVELOPMENT AND METHOD THEREOF |
摘要 |
Disclosed are a system availability measurement device for system development and a method thereof. According to an embodiment of the present invention, the system availability measurement device comprises the following steps of: generating an error in a system and detecting a fault to measure a time for repairing the fault; and measuring system availability by using the measured fault repairing time. |
申请公布号 |
KR20160098929(A) |
申请公布日期 |
2016.08.19 |
申请号 |
KR20150021205 |
申请日期 |
2015.02.11 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
LEE, KWANG YONG;LEE, JUNG HWAN |
分类号 |
G06F11/34 |
主分类号 |
G06F11/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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