| 摘要 |
PURPOSE:To enhance the durability of an IC inspection apparatus, by chamfering the contact terminal of a contact piece to a terminal and applying hard conductive plating to the outer surface thereof. CONSTITUTION:In an IC inspection apparatus 1, contact pieces 3 comprising a spring material are supported by a pair of left and right support frames 2 so as to be opposed in a downwardly directed state. The leading ends of the contact pieces 3 are removed at the corner parts thereof by inverse-electrolysis and protruded circular arc shaped chamfering is performed to the outsides thereof and hard nickel-type plating is applied to each outer surface. Therefore, the durability of the apparatus can be enhanced without impairing the terminal of IC.
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