发明名称 Apparatus for testing circuits within a system
摘要 A capability for internal self-testing is provided for a test instrument in which data, in digital and in analog form, is sampled from various test points. A programmable delay generator is used to process some of the data and to provide strobes which control the data output and which control the sampling of data. This enables measurements to be made at a preselected time after the occurrence of a particular signal, thereby giving the system a capability of using the delay generator not only for providing comparisons of time functions but also for initiating test sub-routines. The self-test capability enables test equipment having time-dependent functions, such as test equipment for video displays, to be verified with respect to accuracy in order to establish a confidence test.
申请公布号 US4554636(A) 申请公布日期 1985.11.19
申请号 US19820429599 申请日期 1982.09.30
申请人 ALLIED CORPORATION 发明人 MAGGI, JOSEPH A.;WILENSKY, BARRY F.
分类号 G01R31/28;G09G5/00;H04N17/00;H04N17/06;(IPC1-7):G01R31/00 主分类号 G01R31/28
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