Arrangement for testing the operability of a semiconductive device

摘要

An arrangement for checking the integrity and operability of a semiconductive device including a control circuit for injecting test signals into a normal control signal to induce a momentary change of the operating condition of the semiconductive device, a sensing circuit connected in parallel with the semiconductive device sensitive to an induced change to produce an output indicating the induced change, and a correlation circuit operative to correlate the test pulses with the sensed response which is arranged to carry out predetermined action in the event that the correlation circuit determines a state of inoperability of the semiconductive device.