发明名称 Method and apparatus for handling charged particle beam
摘要 In a method of and an apparatus for handling a charged particle beam, at least one of a signal representative of the astigmatism and a signal for correction of the astigmatism is obtained by computation on the basis of values detected under a certain condition from signal particles derived from an object which is moved repeatedly at least two directions with respect to a charged particle beam. The amount and direction of astigmatism thus computed are displayed respectively for manual correction. Astigmatism correction and focusing can be also carried out automatically.
申请公布号 US4554452(A) 申请公布日期 1985.11.19
申请号 US19830514632 申请日期 1983.07.18
申请人 ELIONIX, INC. 发明人 SUGANUMA, TADAO
分类号 H01J37/153;H01J37/21;H01J37/28;H01J37/304;H01L21/027;(IPC1-7):G01N23/00 主分类号 H01J37/153
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