发明名称 MANUFACTURE OF SELF-ALIGNMENT TYPE SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the accuracy of a semiconductor region up to a value smaller than minimum resolution size by photolithography by fining a pattern obtained through a normal photolithography technique through annealing treatment for diffusing an impurity. CONSTITUTION:An insulating isolating region 15, a semiconductor region 22 and a contact hole to a semiconductor region separate from the semiconductor region 22 are formed on the same masks 90-93 in a self-alignment manner. When an impurity such as boron is introduced into polycrystalline silicon 7, the generation of a difference between etching rates due to the difference of impurity concentration is utilized, and a pattern obtained through photo-resist treatment is fined through annealing treatment for diffusing the impurity.
申请公布号 JPS60229370(A) 申请公布日期 1985.11.14
申请号 JP19840084028 申请日期 1984.04.27
申请人 HITACHI SEISAKUSHO KK;NIPPON DENSHIN DENWA KOSHA 发明人 KAWAJI MOTONORI;ANZAI AKIO;KURODA SHIGEO;SAKAI TETSUSHI
分类号 H01L21/30;H01L21/027;H01L21/331;H01L29/72;H01L29/73;H01L29/732 主分类号 H01L21/30
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