发明名称 |
HIGH-FREQUENCY SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To prevent the lowering of the withstanding voltage of a high-frequency semiconductor device by forming a diode for protecting a gate oxide film in the chip of an MOS capacitor for matching input impedance. CONSTITUTION:Diodes D4, D5 for protecting a gate oxide film in an MOS field- effect transistor are shaped in the chip of an MOS capacitor for matching input impedance. The MOS capacito for matching input impedance is constituted by an N type substrate 13 for the capacitor, an insulating film 14 and an Al electrode 15. The diodes D4, D5 for protecting the gate oxide film are formed by the N type substrate 13 for the capacitor, a P type diffusion layer 16 and an N type diffusion layer 17. |
申请公布号 |
JPS60229359(A) |
申请公布日期 |
1985.11.14 |
申请号 |
JP19840086414 |
申请日期 |
1984.04.27 |
申请人 |
MATSUSHITA DENKI SANGYO KK |
发明人 |
ISHIKAWA OSAMU;EZAKI TAKEYA |
分类号 |
H01L29/78;H01L21/8234;H01L27/02;H01L27/06;H01L27/088 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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