发明名称 HIGH-FREQUENCY SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the lowering of the withstanding voltage of a high-frequency semiconductor device by forming a diode for protecting a gate oxide film in the chip of an MOS capacitor for matching input impedance. CONSTITUTION:Diodes D4, D5 for protecting a gate oxide film in an MOS field- effect transistor are shaped in the chip of an MOS capacitor for matching input impedance. The MOS capacito for matching input impedance is constituted by an N type substrate 13 for the capacitor, an insulating film 14 and an Al electrode 15. The diodes D4, D5 for protecting the gate oxide film are formed by the N type substrate 13 for the capacitor, a P type diffusion layer 16 and an N type diffusion layer 17.
申请公布号 JPS60229359(A) 申请公布日期 1985.11.14
申请号 JP19840086414 申请日期 1984.04.27
申请人 MATSUSHITA DENKI SANGYO KK 发明人 ISHIKAWA OSAMU;EZAKI TAKEYA
分类号 H01L29/78;H01L21/8234;H01L27/02;H01L27/06;H01L27/088 主分类号 H01L29/78
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