发明名称 DETECTION FOR BEND OF PIN OF IC
摘要 PURPOSE:To detect the bend of the pins of each of integrated circuits in the opposite direction at high speed and accurately by a method wherein light is irradiated toward a direction, wherein the pins are lining up, and the light-receiving parts are made to shift along with the irradiating parts at a prescribed speed in the orthogonal direction to the direction, wherein the pins are lining up, while receiving the light. CONSTITUTION:Integrated circuits 99 are made to descend one by one on a guide member 20. A sensor 32 irradiates light on parts, where the vicinities of the base parts of the pins 98 of each of the integrated circuits 99 pass through; the reflected light is detected; and a signal, which detected the passing condition, is inputted in a computer. A sensor 35 irradiates light towards parts, where the vicinities of the points of the pins 98 pass through, from a luminous part 37; the light is made to totally reflect by a prism 40 being attached to the lower part of the guide member 20; the reflected light is received by a light-receiving part 42; and a signal, which detected the condition to pass through, is inputted in the computer. The bend of the pins is detected by the computer from the detected results by the sensors 32 and 35.
申请公布号 JPS60229356(A) 申请公布日期 1985.11.14
申请号 JP19840084141 申请日期 1984.04.27
申请人 SANWA ELECTONICS KK;KANEMATSU ELECTONICS KK 发明人 ISHIKAWA TAMOTSU
分类号 H01L23/50;H01L21/66 主分类号 H01L23/50
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