发明名称 |
Method and apparatus for determining the penetration and leaching process of conductive phases |
摘要 |
Method for one-time or continuous nondestructive determination of the penetration and leaching process of conductive phases in materials, wherein the conductivity of the material to be examined is measured in thin superposed layers in that, after applying voltage to pairs of oppositely disposed conductor paths associated with these layers, the current flow through separate layers of the material is measured and an increase of the current in increasingly deep layers indicates the advance of the front of the penetrating phase.
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申请公布号 |
US4553087(A) |
申请公布日期 |
1985.11.12 |
申请号 |
US19820393825 |
申请日期 |
1982.06.30 |
申请人 |
GESELLSCHAFT FUER STRAHLEN- UND UMWELTFORSCHUNG MBH, MUENCHEN |
发明人 |
KUEHN, WILHELM;BUNNENBERG, CLAUS |
分类号 |
G01N27/00;G01N27/04;G01N33/38;(IPC1-7):G01N5/02;G01N25/56;G01R27/02 |
主分类号 |
G01N27/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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