发明名称 Method and apparatus for determining the penetration and leaching process of conductive phases
摘要 Method for one-time or continuous nondestructive determination of the penetration and leaching process of conductive phases in materials, wherein the conductivity of the material to be examined is measured in thin superposed layers in that, after applying voltage to pairs of oppositely disposed conductor paths associated with these layers, the current flow through separate layers of the material is measured and an increase of the current in increasingly deep layers indicates the advance of the front of the penetrating phase.
申请公布号 US4553087(A) 申请公布日期 1985.11.12
申请号 US19820393825 申请日期 1982.06.30
申请人 GESELLSCHAFT FUER STRAHLEN- UND UMWELTFORSCHUNG MBH, MUENCHEN 发明人 KUEHN, WILHELM;BUNNENBERG, CLAUS
分类号 G01N27/00;G01N27/04;G01N33/38;(IPC1-7):G01N5/02;G01N25/56;G01R27/02 主分类号 G01N27/00
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