发明名称 |
Fabrication method for controlled via hole process |
摘要 |
A method for forming via holes having a rounded sidewall profile includes exposing a layer or organic positive photoresist to a formic gas plasma while the surface of the photoresist layer is bombarded with ions and electrons in a high voltage biased environment in which the photoresist layer is capacitively coupled. The photoresist layer may be exposed to UV light either before or after the formic gas plasma step.
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申请公布号 |
US4552831(A) |
申请公布日期 |
1985.11.12 |
申请号 |
US19840576991 |
申请日期 |
1984.02.06 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
LIU, CHENG-YIH |
分类号 |
G03F7/00;G03F7/20;G03F7/26;G03F7/38;H01L21/027;H05K3/00;(IPC1-7):G03C5/00;B05D3/06 |
主分类号 |
G03F7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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