发明名称 Apparatus for measuring the gradient or inclination of a surface or of a line
摘要 PCT No. PCT/FR83/00020 Sec. 371 Date Sep. 27, 1983 Sec. 102(e) Date Sep. 27, 1983 PCT Filed Jan. 26, 1983 PCT Pub. No. WO83/02662 PCT Pub. Date Aug. 4, 1983.The invention concerns apparatus for measuring the inclination or gradient of a plane or line. The objective of the invention is apparatus for measuring the inclination or gradient of a plane or line with respect to a predetermined reference plane, comprising a generally rectangular or trapezoidal frame equipped with three outer bearing surfaces disposed at right angles one to another along three of the sides of said frame, a device integral with said frame, sensitive to variations in position in space of said apparatus and which can output a signal proportional to the angular deviation between one of said bearing surfaces and said reference plane, and means of displaying the value of the measurement taken by said sensitive device.
申请公布号 US4551921(A) 申请公布日期 1985.11.12
申请号 US19830541341 申请日期 1983.09.27
申请人 A.B.F. INDUSTRIE S.A. 发明人 PUYO, PHILIPPE;BOUVET, LUCIEN
分类号 G01B3/56;G01C9/06;G01C9/10;(IPC1-7):G01C9/06 主分类号 G01B3/56
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