| 摘要 |
PURPOSE:To conduct the test of a signal route in all time slots between a time division switch including a line concentration switch, an A/D and a D/A converting sections and the line concentration switch by reflecting a test pattern in the line concentration switch. CONSTITUTION:The analog line concentration switch 3 generates a reflected route (a) by a command transmitted from a common controller 8 via a control route 10. The test pattern from a test pattern inserting device 6 is led to the common controller 8 via the D/A converter 4, the analog line concentrator 3, the A/D converter 5 and a test pattern extracting device 7 and the common controller 8 compares the inserted test pattern with the extracted test pattern. The part between the time division channel 9 and the D/A converter 4, the part between the A/D converter 5 and the time division channel 9 and the analog switch line concentration switch 3 are confirmed for the normality. |
