发明名称 |
METHOD AND DEVICE FOR CORRECTING LEVEL FLUCTUATION OF PROBE ROTATION TYPE FLAW DETECTOR |
摘要 |
PURPOSE:To eliminate the fluctuation in a detection level for a defect owing to the mis-alignment between the rotating axis of a probe and a pipe axis by determining and storing said detection level as the function of an angle along the circumference of the pipe by using a reference test piece, using said level in the stage of flaw detection and correcting the sensitivity of flaw detection in real time. CONSTITUTION:The position of the artificial flaw of the reference test piece is preliminarily detected at every prescribed angle by a sensor 7 for detecting the rotating angle of the rotating part 6 of the probe 2 prior to flaw detection and the detection level of said defect is determined as the function of the angle and is stored in a DAC control device 8. The signal of the probe 2 is inputted via pre- and logarithmic amplifiers 11, 12 to a distance-amplitude correcting circuit 9 and the flaw detection sensitivity is corrected in real time by using the function stored in the device 8 in the stage of flaw detection. The signal is separated to inside and outside defect signals ID and OD by a gate circuit 13. |
申请公布号 |
JPS60224060(A) |
申请公布日期 |
1985.11.08 |
申请号 |
JP19840080748 |
申请日期 |
1984.04.21 |
申请人 |
SUMITOMO KINZOKU KOGYO KK |
发明人 |
NAKAO YOSHIYUKI;HIYOUDOU SHIGETOSHI |
分类号 |
G01N27/82;G01B17/00;G01N29/04;G01N29/30 |
主分类号 |
G01N27/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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