| 摘要 |
<p>PURPOSE:To use the same probe card commonly even when an IC pattern and the like are changed, by connecting a measuring probe to a conductor pad trimming circuit resistors with the resistance values being measured, and thereafter cutting an auxiliary resistor by trimming. CONSTITUTION:One end of each of resistors 3b and 3d is commonly connected. The ends are connected to a conductor pad 6b through conductor patterns 2c and 2b and an auxiliary resistor 9. The other ends are connected to conductor pads 6d and 6a, respectively. The resistor 3b is trimmed with the resistance value across the conductor pads 6b and 6d being measured. The resistor 3d is trimmed with the resistance value across the patterns 6a and 6b being measured. When the trimming of the resistors 3b and 3d is finished and the desired values are obtained, the auxiliary resistor 9 is trimmed and cut. Then, the resistors 3b and 3d are not connected to the conductor pad 6b electrically any more.</p> |
