发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PURPOSE:To find an abnormality easily even if a signal transmission line is broken, by connecting a signal generating source to the other end of the signal transmission line, through which a logic control signal is transmitted, through a load means. CONSTITUTION:The second signal generating source V is connected to the other ends of signal transmission lines 4 and 5, through which the logic control LC signal from the first signal generating source 1 is transmitted, through loads 10 and 11. Circuits 6-9 including plural means 6a-9a controlled by the LC signal are connected to transmission lines 4 and 5. When the LC signal is in the high level, transmission lines 4 and 5 go to the high potential and are not affected by the signal source V. When the LC signal is in the low level, transmission lines 4 and 5 are held in the low potential and are not affected by the signal source V. If the transmission line 5 is broken at a point I marked with X, the potential V is impressed to the signal source V through the load 11, and the means 9a is made conductive, and D output data from a signal generating source D9b of the next stage appears on a data bus (b), and thus, the abnormality output is discriminated easily.
申请公布号 JPS60224327(A) 申请公布日期 1985.11.08
申请号 JP19840082278 申请日期 1984.04.23
申请人 MITSUBISHI DENKI KK 发明人 ENDOU HITOSHI
分类号 H03K19/0185;H03K19/00;H03K19/007 主分类号 H03K19/0185
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