发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce the parasitic inductance between a GND and a source when a mounting process is performed as well as to obtain a stabilized amplifying operation and a high power output on a high frequency zone by a method wherein the Au-plated layer to be turned to the source of a semiconductor device is short-circuited using the conductive material filled in a through hole, and said Au-plate layer is formed with the shortest distance. CONSTITUTION:An MOSFET chip 11 is placed on the Au-plated layer 14 located on a stem 12, and the lower surfaces of the chip 11 and the Au-plated layer 14 are joined together using conductive paste. A through hole A is provided on a beryllia substrate 13 and the Au-plated layer 14, and the upper surface and the lower surface of the Au-plated layer 14 are short-circuited by the conductive material B which penetrates the through hole A. As a result, the Au-plated layer 14 is short-circuited at the shortest distance using the conductive material B. As the lower surface of the Au-plated layer 14 is connected to a GND when a mounting process is performed, the parasitic inductance on the upper surface and the lower surfaces of the Au-plated layer 14 is reduced by the above-mentioned short- circuit, thereby enabling to reduce the parasitic inductance between the GND and a source.
申请公布号 JPS60223145(A) 申请公布日期 1985.11.07
申请号 JP19840078456 申请日期 1984.04.20
申请人 HITACHI SEISAKUSHO KK 发明人 MASUDA AKIRA
分类号 H01L23/12;H01L23/66 主分类号 H01L23/12
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