发明名称 STRUCTURE AND PROCESS FOR FABRICATING AN INTEGRATED CIRCUIT
摘要 An improved bipolar transistor structure formed in a very small area of a thin epitaxial layer on a planar surface of a silicon substrate of first conductivity type, said very small area of the thin epitaxial layer having vertical sidewalls extending to the planar surface of said substrate, said area of thin epitaxial layers containing in the order recited a shallow depth emitter region of a second conductivity type having an exposed planar surface, a shallow depth base region of said first conductivity type, and a shallow depth active collector region of said second conductivity type, an elongated region of said first conductivity type surrounding said emitter, base and active collector regions, said elongated region being contained within and coextensive with said vertical sidewalls of said small area of said thin epitaxial layer, whereby the base collector capacitance is materially reduced due to the very small area of the base-collector junction. Also disclosed is a process and alternative process, for fabricating an improved bipolar transistor structure.
申请公布号 DE3172466(D1) 申请公布日期 1985.11.07
申请号 DE19813172466 申请日期 1981.01.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CAVALIERE, JOSEPH RICHARD;HORNG, CHENG TZONG;KONIAN, RICHARD ROBERT;RUPPRECHT, HANS STEPHAN;SCHWENKER, ROBERT OTTO
分类号 H01L21/8222;H01L21/033;H01L21/285;H01L21/331;H01L21/762;H01L27/06;H01L29/73;H01L29/732;(IPC1-7):H01L29/72;H01L21/76 主分类号 H01L21/8222
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