| 摘要 |
PURPOSE:To elevate the operability of a tester and the test efficiency, by storing a test data of a serial pattern into the area of a memory corresponding to the type in such a manner as to be divided by the length of bit equal to the number of pin electronics package channels to facilitate the data generation. CONSTITUTION:In a tester such as board tester used to inspect functions of a complicated logical circuit comprising numerous elements, a test data is stored into a pattern memory 7 of the tester with an address counter 5, word number counter 6 and a pattern type counter 8. Here, the test data of the serial pattern is automatically stored into a corresponding memory area in a folded manner by the length of bit equal to the number of pin electronics packaged channels according to the types of patterns (the pattern of input/output data, mask pattern, the pattern corresponding to a high impedance circuit). |
