发明名称 POLISHING METHOD FOR BACK SURFACE OF SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE:To shorten the procedure by removing processes with dangers such as the use of organic flux by a method wherein the main surface of a semiconductor substrate finished in wafer processing is covered with a water-soluble resin film, and the back surface of the substrate is flatly ground. CONSTITUTION:The main surface of the semiconductor substrate is coated with a protection film made of a water-soluble resin (polymer substance). 1.0-2.0 [mum] is suitable for the coating thickness. Next, the main surface side of the substrate is fixed from above with a vacuum chuck or the like. Using an organic flux such as freon (carbon tetrafluoride) which does not dissolve the water-soluble resin of the protection film of polyvinyl alcohol, etc. for the cooling liquid, the back surface of the substrate is flatly ground with a grinding plate similar to the conventional one rotating at high speed.
申请公布号 JPS60219750(A) 申请公布日期 1985.11.02
申请号 JP19840076877 申请日期 1984.04.17
申请人 FUJITSU KK 发明人 NAKAMURA MASAKI;FUJIE NOBUO;TABUCHI SHIYUUJI;YAMANO MASAOMI
分类号 B24B7/20;H01L21/302;H01L21/304 主分类号 B24B7/20
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