发明名称 Circuit arrangement for monitoring the temperature of integrated circuits
摘要 To monitor the temperature of integrated circuits and/or devices containing such integrated circuits, a threshold switch (which may have hysteresis), the output signal (which may be combined in a wired-OR) of which indicates the maintenance or the transgression of a predetermined temperature threshold, is supplied with the forward voltage of a diode implemented on a chip. For this purpose, the diode can be arranged in a branch of a voltage-fed bridge circuit, the output terminals of which bridge are connected to the two inputs of an operational amplifier outputting the output signal.
申请公布号 DE3415764(A1) 申请公布日期 1985.10.31
申请号 DE19843415764 申请日期 1984.04.27
申请人 SIEMENS AG 发明人 BINZ,REINER,DIPL.-ING.;FIEBIG,HANS-HELMUT,DIPL.-ING.;HOELZLE,JOSEF,DIPL.-ING.;SCHMIDT,CLEMENS,DR.
分类号 G01K7/01;(IPC1-7):H01L23/56;G01K7/00;H02H7/20;H03K17/30 主分类号 G01K7/01
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