发明名称 |
Circuit arrangement for monitoring the temperature of integrated circuits |
摘要 |
To monitor the temperature of integrated circuits and/or devices containing such integrated circuits, a threshold switch (which may have hysteresis), the output signal (which may be combined in a wired-OR) of which indicates the maintenance or the transgression of a predetermined temperature threshold, is supplied with the forward voltage of a diode implemented on a chip. For this purpose, the diode can be arranged in a branch of a voltage-fed bridge circuit, the output terminals of which bridge are connected to the two inputs of an operational amplifier outputting the output signal.
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申请公布号 |
DE3415764(A1) |
申请公布日期 |
1985.10.31 |
申请号 |
DE19843415764 |
申请日期 |
1984.04.27 |
申请人 |
SIEMENS AG |
发明人 |
BINZ,REINER,DIPL.-ING.;FIEBIG,HANS-HELMUT,DIPL.-ING.;HOELZLE,JOSEF,DIPL.-ING.;SCHMIDT,CLEMENS,DR. |
分类号 |
G01K7/01;(IPC1-7):H01L23/56;G01K7/00;H02H7/20;H03K17/30 |
主分类号 |
G01K7/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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