发明名称 AUTOMATIC GRAIN EXAMINATION APPARATUS
摘要 PURPOSE:To perform unattended operation after the slight amount of action at the start of detection, by giving the input instruction of a sample to be tested into a sample testing part to the sample receiving part, at every time when one step of machining and selecting process at the testing part is finished. CONSTITUTION:A sample receiving part 5 separately receives a sample to be tested and is constituted of hoppers 61-6N, in which gates are attached to bottom discharge ports. A control device 8 separately gives instructions at the opening times of the gates of the hoppers 61-6N. The control device 8 receives a sample request signal P as an input signal, which indicates the fact that one step of the machining and selecting process is finished, from a husker 2 or selector 3, and performs the control. In testing, the operator only inputs the first sample (a)- the Nth sample (c) to the hoppers 61-6N, sets the sample receiving number at a sample-receiving-number setting part 11 and gives the starting instruction (d) to the control device 8. Thereafter unattended operation can be carried out.
申请公布号 JPS60213825(A) 申请公布日期 1985.10.26
申请号 JP19840069790 申请日期 1984.04.06
申请人 KUBOTA TEKKO KK 发明人 HINO MASAMICHI;MIZUNO IKUO;CHIBA TSUGUKAZU
分类号 G01G13/00;G01G23/00;G01G23/01;G01G23/36 主分类号 G01G13/00
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