发明名称 ELECTRON MICROSCOPE
摘要 PURPOSE:To improve the operation efficiency of an electron microscope and achieve its stable condition in a short time by automatically operating a means for producing and accelerating electron rays, a means for deflecting them and a lens system for converging electron rays and forming an image after a hard vacuum is produced by detecting the vacuum degree of the mirror tube. CONSTITUTION:Within the mirror tube 27 of an electron microscope, electron rays 28 are converged and deflected before being irradiated upon a sample 5 and then electron rays passing through the sample 5 are magnified by an image formation lens system 6 to project an image upon a fluorescent plate 7. The vacuum degree of the mirror tube 27 is detected with a detector 8 and a vacuum meter 20 and a signal produced when a given vacuum degree is achieved is sent into a micro processor 23. The signal from the processor 23 and data read from (ROM24) and (RAM25) are passed through read-out DA converters 17, 18 and 19 respectively before being used to apply acceleration voltage and to excite a lens coil and a deflection coil. In addition, data for cancelling the starting drift are used to achieve a shift to a stable condition. Therefore, the electron microscope can be automatically used only by turning on an operation switch for the exhaust system, thereby facilitating handling of the electron microscope.
申请公布号 JPS60212954(A) 申请公布日期 1985.10.25
申请号 JP19840069027 申请日期 1984.04.09
申请人 HITACHI SEISAKUSHO KK 发明人 KAMIMURA MASASHI
分类号 H01J37/22;H01J37/18;H01J37/26 主分类号 H01J37/22
代理机构 代理人
主权项
地址
您可能感兴趣的专利