| 摘要 |
PURPOSE:To easily and accurately measure the changing process of the optical characteristic of an optical memory member due to the temperature change when the temperature of the member is cause to rise in a short time, by increasing the temperature of a sample composed of a thin film provided on a transparent substrate at a fixed rate and detecting the reflected light and transmitted light of a light projected upon the thin film with photodetectors. CONSTITUTION:A sample composed of a thin film 2 provided on a transparent substrate 1 is supported by a heating section 3 equipped with a hole at the center and the temperature of the sample is increased at a fixed rate. Then the light of a light source 4 is projected upon the sample through a half-mirror 7. The transmitted light of the light is made incident to a photodetector 5 through the hole of the heating section 3 and, at the same time, the reflected light is made incident to another photodetector 6 after it is reflected by the half mirror 7. Therefore, the changing process of the light transmittance and reflectivity of the optical memory member at the time of temperature rise can be measured easily and accurately in a short time. |
