发明名称 ACTIVE LEAKAGE RESISTANCE CONTROL TO IMPROVE NUMERICAL CONVERGENCE IN AN ELECTRONIC CIRCUIT SIMULATOR WHICH SEEKS CIRCUIT SOLUTIONS ITERATIVELY
摘要 Operation of an electronic circuit simulator is improved by actively controlling the test leakage resistance values at junctions (12) of active devices while seeking stable circuit solutions of modeled circuitry. By choosing an initial junction leakage resistance value lower that the actual value in each active device being modeled, convergent circuit solutions can be easily obtained, which may in turn be used as initial conditions to achieve the circuit solution for the real circuit with a significantly improved effectiveness.
申请公布号 WO8504739(A1) 申请公布日期 1985.10.24
申请号 WO1985US00486 申请日期 1985.03.19
申请人 ADVANCED MICRO DEVICES, INC. 发明人 WANG, SANG, S.;FANG, SHENG;BURKHARDT, ROBERT, JOHN
分类号 G06F19/00;G06F17/50;(IPC1-7):G06G7/48 主分类号 G06F19/00
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