| 摘要 |
PURPOSE:To improve the test efficiency of a magnetic bubble memory device by providing a circuit which writes test results in a PROM for storage of defective loop information of the magnetic bubble memory device, to shorten the write time of the PROM. CONSTITUTION:A PROM write circuit 10 is provided between a control circuit 1 and a PROM8. After the test, the circuit 10 is used to write data stored in an information storage circuit 6 onto the PROM8 in a magnetic bubble memory device 9 of cassette type. Consequently, the write time to the PROM8 is shortened to improve the test efficiency of the magnetic bubble memory device. |
