| 摘要 |
PURPOSE:To measure the forming elapse of a daughter ion, by performing the intensity of an electric field in matching relation to the daughter ion by a double converging type mass spectrometer and detecting the peak appearing at the position of specific mass. CONSTITUTION:In a reverse arrangement type double converging mass spectrometer, when ion acceleration voltage between an ion source 1 and a magnetic field 2 is set to V0, the energy E0=eV0 of an original parent ion is constant regardless of the mass of the parent ion. Herein, when the parent ion with mass M0 is creavaged and daughter ions with mass M are generated, the voltage of an energy analyzing electric field 3 is set so as to pass an ion with energy E= E0 (M/M0) and the mass scanning of a magnetic field 2 is performed to generate peaks P1, P2 at places of masses M<2>/M0 and M0. The peak P1 is the intensity of daughter ions generated when the creavage of the parent ion is occured before incident to the magnetic field and the peak P2 is the intensity of daughter ions formed between the magnetic field and the electric field. As mentioned above, the formation of daughter ions can be detected and quantitatively measured by one scanning of the magnetic field. |
