发明名称 Process and device for detecting defects on or in scannable sound carriers
摘要 A process and a device for detecting defects on sound carriers, in particular disks, is specified, in which a comparison is performed between a signal peak value and a signal integral value. According to the invention, a first integral value and a first peak value are continuously formed for a first period of time and a second integral value and a second peak value are continuously formed for a second period of time. Each peak value is then compared with the two integration values on either side of it of the respectively other period of time to determine a defect signal.
申请公布号 DE3413272(A1) 申请公布日期 1985.10.17
申请号 DE19843413272 申请日期 1984.04.07
申请人 TELDEC SCHALLPLATTEN GMBH 发明人 HANS DITTMAR,ARNO
分类号 G11B20/02;(IPC1-7):G11B27/36 主分类号 G11B20/02
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