| 摘要 |
PURPOSE:To obtain such an IC testing device with the large degree of freedom in which the test head is usable while devided optionally by controlling switches through a pin size selector. CONSTITUTION:The control over which of four AND gates 15A-15C of switches 12A-12D is opened is determined under the control of the pin size selector 11 to switch the pin size of the test head 3 to a state wherein four pin areas 3A-3D are used individually, a state wherein pin areas 3A and 3B, and 3C and 3D are used as two pin areas, or a state wherein all pins of the head 3 are used as one area. Thus, the switches 12A-12D are controlled through the selector 11 to divide the head 3 into optional areas and use it, thereby obtaining the IC testing device with the large degree of freedom. |
