| 发明名称 |
Two-dimensional radiation detecting apparatus |
| 摘要 |
A two-dimensional X-ray detecting apparatus is comprised of an amorphous silicon layer for trapping electrons in a pattern corresponding to an intensity distribution when it is receiving X-rays, and a scanning device for scanning the surface of the amorphous silicon layer with a laser beam to take out electrons trapped in the silicon layer.
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| 申请公布号 |
US4547670(A) |
申请公布日期 |
1985.10.15 |
| 申请号 |
US19830486514 |
申请日期 |
1983.04.19 |
| 申请人 |
TOKYO SHIBAURA DENKI KABUSHIKI KAISHA |
发明人 |
SUGIMOTO, HIROSHI;NARUSE, YUJIRO |
| 分类号 |
G01T1/164;G01N23/04;G01T1/00;G01T1/29;G03B42/02;(IPC1-7):G01T1/24;H01L31/02 |
主分类号 |
G01T1/164 |
| 代理机构 |
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代理人 |
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| 主权项 |
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