发明名称 Engineering change facility on both major surfaces of chip module
摘要 A multiple chip module is provided with an engineering change (EC)/repair facility by means of delete lines located on both major surfaces of the module. In one embodiment, defective pin vias through the module are repaired by use of the delete lines on both major surfaces.
申请公布号 US4546413(A) 申请公布日期 1985.10.08
申请号 US19840626277 申请日期 1984.06.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FEINBERG, IRVING;KRAUS, CHARLES J.;STOLLER, HERBERT I.
分类号 H01L25/18;H01L23/538;H01L25/04;H05K1/00;H05K1/03;H05K3/22;(IPC1-7):H05K7/06 主分类号 H01L25/18
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