发明名称 MEASUREMENT OF SURFACE DEFECT
摘要 PURPOSE:To detect the depth and shape of surface defects, by forcing a modeling agent into surface defects to obtain a replica for the shape thereof. CONSTITUTION:A surface defect measuring apparatus is made up of a press tool 6, a casing 3, a press plate 7 and a base rubber 9 and pours a liquid modeling agent (silicone rubber) 2 into a surface defect 1 to be measured in the casing 3 through a hole 5, a thread hole 8 and a hole 10. Then, the press tool 6 is screwed with a thread hole of the press plate 7 and pressed down with a slight move of a hook 4 to force the modeling agent 2 into the surface defect 1. As the modeling agent 2 is adhered to the base rubber 9, the solidified agent is withdrawn by pulling up the base rubber 9. The replica thus obtained is measured with an expansion projector or the like to determine the depth and the overall shape of the surface defect.
申请公布号 JPS61133838(A) 申请公布日期 1986.06.21
申请号 JP19840255683 申请日期 1984.12.05
申请人 MITSUBISHI HEAVY IND LTD;RYOMEI ENG CORP LTD 发明人 KAJIMOTO KATSUYA;SAEKI TERUO
分类号 G01B1/00;G01N19/08;(IPC1-7):G01N19/08 主分类号 G01B1/00
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