发明名称 TWO-DIMENSIONAL DISTORTION MEASURING METHOD BY SCANNING MOIRE METHOD
摘要 PURPOSE:To analyze a sample having a large distortion range by obtaining a distortion line by separating specifically two moire patterns from a picture which has thinned out an input picture of a lattice-shaped model grid, in two directions, and two pictures which have varied a thinned-out phase of both the directions. CONSTITUTION:A lattice-shaped model grid drawn on a sample is brought to image pickup by a television camera 1 and stored by a picture processing device 4, read out by a personal computer 6 and brought to operation processing. In that case, the first thinned-out picture is formed by thinning out an input picture in two crossing directions, the second thinned-out picture is formed by varying a phase only in the first direction and thinning out said picture in two directions, and the third thinned-out picture is formed by varying the phase only in the second direction and thinning out the picture in two directions. Subsequently, the first moire pattern is separated by superposing the first and the second pictures, the second moire pattern is separated by superposing the first and the third pictures, and a distortion line of two-dimension, etc. is obtained from both the patterns.
申请公布号 JPS60195406(A) 申请公布日期 1985.10.03
申请号 JP19840052480 申请日期 1984.03.19
申请人 OOSAKA DAIGAKU 发明人 MORIMOTO YOSHIHARU
分类号 G01B11/16;G01L1/00;(IPC1-7):G01B11/16 主分类号 G01B11/16
代理机构 代理人
主权项
地址
您可能感兴趣的专利