| 摘要 |
The present invention relates to devices for the quality control of the electrical insulation of printed circuits made in particular in multiple layers superposed on insulating supports of laminar structure by means of conventional or hybrid technologies. To this end, the testing device according to the invention essentially comprises: a specific sensor circuit constituted by a supple insulating screen comprising a plurality of conducting studs with one and only one stud for each conductive printed circuit path; a scanning circuit associated with said sensor circuit comprising a metallized insulating layer having at least two coplanar conducting zones insulated by at least one transverse electrical discontinuity; a measuring apparatus indicative of the galvanic insulation existing between two contiguous conducting zones of said scanning circuit. The testing is performed by moving the scanning circuit and detecting for a short between two intentionally separate conductive printed circuit paths which would close the circuit between the two conducting zones of the scanning circuit.
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