发明名称 Apparatus for testing light fastness of a material
摘要 An apparatus for testing light fastness of a material having a housing with a test chamber therein and two downwardly and outwardly inclined specimen supporting walls on opposite sides of the chamber and two rows of horizontally positioned equal intensity ultraviolet fluorescent lamps one lying generally along each of the specimen supporting walls, with four lamps in each row. The uppermost lamp in each row is spaced downwardly from the upper edge of the specimen supporting wall and the next lower lamp is spaced above the midpoint of the vertical dimension of the wall substantially equal distances, the uppermost and next lower lamps being spaced from each other slightly less than twice the equal distance. The still next lower lamp is spaced downwardly from the midpoint and the lowermost lamp is spaced upwardly from the lower edge of the specimen supporting wall slightly more than half the distance the still next lower lamp is spaced downwardly from the midpoint, the lowermost lamp being spaced from the still next lower lamp slightly less than the still next lower lamp is spaced from the midpoint. The uppermost lamp is spaced perpendicular to the specimen supporting wall about one-sixth of the vertical dimension thereof, the lowermost lamp is spaced slightly closer to the wall than the uppermost lamp, the still next lower lamp is spaced slightly farther from the wall than the uppermost lamp, and the next lower lamp is spaced still slightly farther from the wall than the still next lower lamp.
申请公布号 US4544995(A) 申请公布日期 1985.10.01
申请号 US19830501397 申请日期 1983.06.06
申请人 SUGA, SHIGERU 发明人 SUGA, SHIGERU
分类号 G01N17/00;(IPC1-7):G01N17/00;F21S3/00 主分类号 G01N17/00
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