| 摘要 |
<p>An arrangement for the accurate filling of analog values can be tested by using a short-duration test protocol for using and analysing all functions of the arrangement, which then automatically returns to the precise status existing before the test protocol was implemented. A time interval of the order of magnitude of one millisecond is reserved for feeding in test pulses, for the settling time and the return of the arrangement to its initial state. The correct return of the arrangement to its initial state before the test is critical so that the generation of a state ambiguity due to programmed hysteresis is avoided in the analog trigger values. An embodiment of an analog trigger module contains a preprocessing circuit (14) which is connected to an analog signal source (16) and to a diagnostic test circuit (36, 41), and a circuit module (10) which receives signals from the preprocessing circuit (14). The module (10) contains several trigger indicators (18, 20, 22) and a circuit arrangement for detecting coarse failures. The diagnostic circuit (36, 41) applies the test signals to the preprocessing circuit (14), both for testing and for resetting the trigger indicators (18, 20, 22). <IMAGE></p> |
