发明名称 TEST SYSTEM OF TERMINAL DEVICE
摘要 PURPOSE:To test easily an unattended terminal device by inverting the feeding polarity from an exchange station, applying a power to a power reception circuit of a terminal device to bring the terminal device into the operating state and obtain the response signal. CONSTITUTION:When a test command signal TST is supplied to a test circuit 13 of an exchange station 1, a power feeding polarity inversion command is fed from the circuit 13 to a transmission/reception circuit 12 and the polarity of subscriber lines (a), (b) is inverted from -, + into +, -. Then a power is fed to the power reception circuit 21 to the exchange station 1 via a diode circuit 22 of a terminal device 2 and the circuit 21 is brought into the operating state. The circuit 13 generates test information and when it is fed to the terminal device 2 via the circuit 12, a test response circuit 27 of the terminal device 2 receives the test information via the transmission/reception circuit 25, generates response information corresponding to the test information and transmits it from the circuit 25 to the exchange station 1. The circuit 13 of the exchange station 1 receives the response signal via the circuit 12 to decide the abnormity of the terminal device 2.
申请公布号 JPS60191544(A) 申请公布日期 1985.09.30
申请号 JP19840048630 申请日期 1984.03.13
申请人 FUJITSU KK 发明人 KAMOI NOBUHISA;KIMURA SHIYUUJI;NARITA KENJI;YOU KATSUHIRO
分类号 H04M11/06;G06F13/00;H04M3/26;H04M3/30;H04M11/00 主分类号 H04M11/06
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