发明名称 MOS TYPE SOLID-STATE IMAGE PICKUP ELEMENT
摘要 PURPOSE:To decrease the sensitivity of an infrared area and to suppress blooming, etc., by forming a semiconductor layer of the 2nd conduction type under a semiconductor layer. CONSTITUTION:An N type semiconductor substrate is used as a substrate 8, a P type area 9 is formed on the N type semiconductor substrate 8, and N type diffusion layers 2 and 4 are formed in the P type area 9. When light incident between the N type semiconductor substrate 8 and P type area 9 while a bias voltage 10 is applied, a photoelectron generated in the depletion layer 11 formed of the substrate 8 and P type area 9 flows toward the substrate 8 and an effective signal is only a photoelectron generated more adjacently to the surface than the diffusion layers 2 and 4. Consequently, the sensitivity becomes small in the infrared area. The width of the depletion layer 11 is varied freely with the bias 10, so desired sensititivity is set.
申请公布号 JPS60186176(A) 申请公布日期 1985.09.21
申请号 JP19840042414 申请日期 1984.03.06
申请人 SUWA SEIKOSHA KK 发明人 TAKENAKA KAZUHIRO
分类号 H01L27/146;H01L27/14;H04N5/335;H04N5/359;H04N5/374 主分类号 H01L27/146
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