发明名称 PHOTOMASK
摘要 PURPOSE:To increase the adhesive force between a quartz glass substrate and a light shielding film and to prevent the exfoliation of a mask pattern by introducing an impurity reacting with the material of the light shielding layer into the surface region of the substrate. CONSTITUTION:Quartz glass is used as a substrate 1 and calcium ions are implanted as an impurity reacting with the material forming a light shielding film to form an impurity introduced layer 2 having several - several tens A thickness. Chromium or chromium oxide is deposited by sputtering as a light shielding film 3 to about 1,000A thickness on the surface of the substrate. A mask pattern is formed by an ordinary process on the above-mentioned blank. The entire surface of the substrate is plasma-etched, if necessary, in order to remove the impurities on the substrate surface exposed as a result of formation of the above-mentioned mask pattern. Calcium is used as an impurity to be introduced into the substrate and the other material which reacts with the material forming the light shielding material, for example, sodium, chlorine, bromine, etc. are also usable.
申请公布号 JPS60185952(A) 申请公布日期 1985.09.21
申请号 JP19840041594 申请日期 1984.03.05
申请人 FUJITSU KK 发明人 SHIGEMATSU KAZUMASA
分类号 G03F1/00;G03F1/60;H01L21/027 主分类号 G03F1/00
代理机构 代理人
主权项
地址