发明名称 TEST SYSTEM OF ELECTRONIC APPARATUS
摘要 PURPOSE:To enable the simple test system of an electronic apparatus, by supplying predetermined data to a control means when erroneous data is generated in a folding test. CONSTITUTION:A transmission terminal (a) and a receiving terminal (b) are shortened by a folded line (c). The gate part 13 receiving data from a random data generator 11 allows said data to pass because a signal is not outputted from a latch part 15 and folded through a route of interface part 17 driver 8 terminal (a) terminal (b) receiver 9 interface part 7 to be returned to a comparator 14. The comparator 14 compares the output data of the generator 11 and folded data and, if both data are same, it is judged that the quality of each route part is held. If not same, the comparator 14 outputs a predetermined signal to the latch parth 15. The latch part 15 lights a display lamp 10 and performs output to the gate part 13 to change over the output of an oscillator 11 to the output data (all 1) of a continuous pattern data generator 12. This all 1 data is successively traced by an oscilloscope to make it possible to easily search an obstacle location.
申请公布号 JPS60181662(A) 申请公布日期 1985.09.17
申请号 JP19840037841 申请日期 1984.02.29
申请人 FUJITSU KK 发明人 KOBAYASHI NORIO
分类号 G01R31/00;G07D9/00 主分类号 G01R31/00
代理机构 代理人
主权项
地址