发明名称 Process for fabricating pedestal interconnections between conductive layers in an integrated circuit
摘要 A process for fabricating pedestal interconnections between conductive layers in an integrated circuit includes the steps of (a) forming a first conductive layer over a semiconductor substrate; (b) applying a stop etch layer to said first conductive layer, the stop etch layer having a different etch property than the first conductive layer; (c) patterning the first conductive layer and the stop etch layer in an interconnection pattern which includes widened regions wherever a pedestal interconnection is to be formed; (d) selectively etching the stop etch layer until the stop etch layer remains as a stop etch cap only in central sections of the widened regions; and (e) selectively etching the first conductive layer to a selected depth whereby a pedestal is formed underneath the stop etch caps. The following optional steps may be added: (f) applying a layer of an insulating material over the first conductive layer; and (g) planarizing the insulating layer to expose the tips of the pedestals.
申请公布号 US4541893(A) 申请公布日期 1985.09.17
申请号 US19840610450 申请日期 1984.05.15
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KNIGHT, COLIN W. T.
分类号 H01L21/768;(IPC1-7):C23F1/02;B44C1/22;C03C15/00;C03C25/06 主分类号 H01L21/768
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