发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form a pattern for a resist film so as to have a side surface inclining to a base body for the resist film, and to shape a small-sized contact hole, an opening section thereof takes a funnel shape, through anisotropic etching by executing a plurality of exposure while superposing exposure regions and making the size of said regions differ. CONSTITUTION:A resist film 5a is formed on a substrate 2 with a transistor electrode 1, a region in size conformed to a funnel-shaped opening section in a contact hole 3a is exposed in the quantity of exposure smaller than a normal method, and a section 8a is removed through development. A region in size conformed to the bottom of the contact hole 3a at the center of the base of 8a is exposed, and a section 8b is removed through development to form an opening 6a. The resist film 5a and an insulating film 4 are etched until a hole bored to the insulating film 4 reaches to the transistor electrode 1 under conditions in which the etching rates of the resist film 5a and the insulating film 4 are made approximately the same through anisotropic dry etching while using the resist film 5a as a mask. The shape of the opening 6a is transferred to the insulating film 4 as it is, and the funnel-shaped opening contact hole 3a in upper size (a) and lower size (b) is formed to the insulating film 4.
申请公布号 JPS60178635(A) 申请公布日期 1985.09.12
申请号 JP19840033525 申请日期 1984.02.24
申请人 FUJITSU KK 发明人 MARUYAMA TAKASHI
分类号 H01L21/306;G03F7/20;H01L21/027;H01L21/28;H01L21/302;H01L21/3065 主分类号 H01L21/306
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