发明名称 |
CONNECTION CIRCUIT OF TEST WAVEFORM GENERATOR |
摘要 |
PURPOSE:To attain a surge characteristic test with a test waveform having large energy and also to apply the test waveform to a test circuit which no deterioration of the rise characteristic of an output waveform of a waveform generator, by connecting a varisterl and a capacitor in parallel to form a connection circuit. CONSTITUTION:The electrostatic capacity C1 of an equivalent circuit shown in a figure (a) is shown together with the input capacity C2 of a circuit to be tested. The ramp wave input fed from a generator A is assumed as Vin together with the action start voltage of a varister is assumed as Vz, respectively. Thus a test voltage waveform V(t) which is supplied to the circuit to be tested via an internal equivalent resistance R is kept at [Vin-V(t)]<=Vz until the varister of a connection circuit reaches the voltage Vz. Then V(t)=Vin-Vz is satisfied after the varister reaches Vz. In such a case, the rise characteristics producing a time delay are equal to the ramp wave input Vin as long as C1<<C2 is satisfied. However the varister serving as a connection circuit is delayed more to reach an active area as the C1 becomes larger than the C2. At the same time, the rise characteristics are improved. Therefore a high tolerance level is secured by a varister Z in a constitution of a figure (b). Then the waveform rise characteristics are improved with parallel connection of capacitors C. |
申请公布号 |
JPS60178761(A) |
申请公布日期 |
1985.09.12 |
申请号 |
JP19840033965 |
申请日期 |
1984.02.24 |
申请人 |
NIPPON DENSHIN DENWA KOSHA |
发明人 |
YAMADA HIROKI;DEGUCHI FUMIHIKO |
分类号 |
H04M3/26;(IPC1-7):H04M3/26 |
主分类号 |
H04M3/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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