发明名称 CONNECTION CIRCUIT OF TEST WAVEFORM GENERATOR
摘要 PURPOSE:To attain a surge characteristic test with a test waveform having large energy and also to apply the test waveform to a test circuit which no deterioration of the rise characteristic of an output waveform of a waveform generator, by connecting a varisterl and a capacitor in parallel to form a connection circuit. CONSTITUTION:The electrostatic capacity C1 of an equivalent circuit shown in a figure (a) is shown together with the input capacity C2 of a circuit to be tested. The ramp wave input fed from a generator A is assumed as Vin together with the action start voltage of a varister is assumed as Vz, respectively. Thus a test voltage waveform V(t) which is supplied to the circuit to be tested via an internal equivalent resistance R is kept at [Vin-V(t)]<=Vz until the varister of a connection circuit reaches the voltage Vz. Then V(t)=Vin-Vz is satisfied after the varister reaches Vz. In such a case, the rise characteristics producing a time delay are equal to the ramp wave input Vin as long as C1<<C2 is satisfied. However the varister serving as a connection circuit is delayed more to reach an active area as the C1 becomes larger than the C2. At the same time, the rise characteristics are improved. Therefore a high tolerance level is secured by a varister Z in a constitution of a figure (b). Then the waveform rise characteristics are improved with parallel connection of capacitors C.
申请公布号 JPS60178761(A) 申请公布日期 1985.09.12
申请号 JP19840033965 申请日期 1984.02.24
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 YAMADA HIROKI;DEGUCHI FUMIHIKO
分类号 H04M3/26;(IPC1-7):H04M3/26 主分类号 H04M3/26
代理机构 代理人
主权项
地址