发明名称 Production of semiconductor structures with buried resistive or conductive regions by controlled ion bombardment and heat treatment
摘要 The property of Group III-V compound materials, whereby ion bombarded material becomes highly resistive but recovers its original low resistivity by annealing at a temperature which is dopant and material dependant, is utilized to fabricate integrated circuits which include buried semiconductor interconnections or bus bars between devices.
申请公布号 US4539743(A) 申请公布日期 1985.09.10
申请号 US19830555506 申请日期 1983.11.28
申请人 AT&T BELL LABORATORIES 发明人 ANTHONY, PHILIP J.;HARTMAN, ROBERT L.;KOSZI, LOUIS A.;SCHWARTZ, BERTRAM
分类号 H01L21/265;H01L21/266;H01L21/324;H01L21/74;H01L21/76;H01L21/8252;H01L27/15;(IPC1-7):H01L21/263;H01L21/26 主分类号 H01L21/265
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