发明名称 CHARGED BEAM EXPOSURE UNIT
摘要 PURPOSE:To reduce the heating time while improving the throughout of exposure, by heating material in a preliminary chamber which has been evacuated according to a previously set heating pattern. CONSTITUTION:In a electron-beam exposure unit, a material chamber 11 is connected to a preliminary chamber 15 through a gate valve 14. Over the material chamber 11 provided is an electron-beam optical barrel 20 comprising an electron gun 16, a lens system 17, a deflection system 18 and an aperture mask 19. an electron beam is irradiated to a material 12 in the chamber 11 by the optical barrel 20 so that the material 12 is exposed in a desired pattern. A heating member 21 such as nichrome wire is provided in the preliminary chamber 15 while a heating control unit 22 is provided for controlling the heating of the material 12 by this heating member 21 according to a previously set heating pattern. The temperature of the material 12 can be thereby rapidly controlled to the predetermined set temperature after the preliminary chamber 15 is evacuated.
申请公布号 JPS60171725(A) 申请公布日期 1985.09.05
申请号 JP19840028084 申请日期 1984.02.17
申请人 TOSHIBA KK 发明人 NINOMIYA MASAHARU
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/30 主分类号 G03F7/20
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