发明名称 Semiconductor memory device with a bit error detecting function.
摘要 <p>A memory matrix array (12) consists of a plurality of memory cells (11) with addresses expressed by a plurality of bits. The parity bit for the data stored in all of the memory cells of each linear memory cell array in the row direction are stored in the corresponding one of a plurality of parity storage cells (14A). Storage is made into second and third parity storage cells (14B, 14C), respectively, the parity bits for the data stored in all of the memory cells which are specified such that the corresponding bits of the addresses of said memory cells are high in logical level. In a read mode, the parity is read out from said first to third parity storage cells (14A, 14B, 14C) of the parity memory circuit (13).</p>
申请公布号 EP0153752(A2) 申请公布日期 1985.09.04
申请号 EP19850102254 申请日期 1985.02.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TSUJIMOTO, JUN-ICHI C/O PATENT DIVISION
分类号 G06F12/16;G06F11/10;G11C29/00;G11C29/42;(IPC1-7):G06F11/10 主分类号 G06F12/16
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